Linux系统查看硬盘的使用时间--使用smartmontools
发布日期:2022-03-18 18:19:18 浏览次数:6 分类:技术文章

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我的个人博客:


smartmontools

windows系统里有很多好用的软件可以查看硬盘的总使用时长,Linux下也有类似的工具smartmontools。

S.M.A.R.T. (Self-Monitoring, Analysis and Reporting Technology; often written as SMART)
现在的硬盘基本都支持SMART
对于Debian,Ubuntu系统:

apt-get install smartmontools

其他系统的库里也有smartmontools。

使用如下命令查看硬盘挂载在哪个目录下

df -h

比如说我的硬盘挂载在/dev/sda1,使用如下命令查看。

smartctl --all /dev/sda1

结果如下:

smartctl 6.6 2016-05-31 r4324 [armv7l-linux-4.14.71-v7+] (local build)Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org=== START OF INFORMATION SECTION ===Vendor:               LenovoProduct:              USB Hard DriveRevision:             1ACompliance:           SPC-4User Capacity:        1,000,204,886,016 bytes [1.00 TB]Logical block size:   512 bytesSerial number:        624P0LOTDevice type:          diskLocal Time is:        Tue Nov 13 10:32:38 2018 HKTSMART support is:     Available - device has SMART capability.SMART support is:     DisabledSMART Disabled. Use option -s with argument 'on' to enable it.

发现并没有读到我们想要的信息,我们需要把SMART 打开,使用如下命令:

smartctl -s on --all /dev/sda1

读取成功

可以使用管道直接看到上电使用时间:

smartctl -s on --all /dev/sda1 | grep Power_On_Hours

结果如下:

9 Power_On_Hours          0x0032   094   094   000    Old_age   Always       -       2648

最后一个数字2648表示用了2648小时了。

如果你读取用USB连接的移动硬盘时,很可能会出现如下错误:

=== START OF INFORMATION SECTION ===...SMART support is:     Available - device has SMART capability.SMART support is:     EnabledTemperature Warning:  Disabled or Not Supported=== START OF READ SMART DATA SECTION ===SMART Health Status: OKCurrent Drive Temperature:     0 CDrive Trip Temperature:        0 CError Counter logging not supportedDevice does not support Self Test logging

那么使用如下命令可以解决问题:

smartctl -d sat --all /dev/sda1

输出结果如下:

smartctl 6.6 2016-05-31 r4324 [armv7l-linux-4.14.71-v7+] (local build)Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org=== START OF INFORMATION SECTION ===Device Model:     TOSHIBA MQ01ABD100MSerial Number:    8624P0LOTLU WWN Device Id: 5 000039 7323008ceFirmware Version: AX1P1AUser Capacity:    1,000,204,886,016 bytes [1.00 TB]Sector Sizes:     512 bytes logical, 4096 bytes physicalRotation Rate:    5400 rpmForm Factor:      2.5 inchesDevice is:        Not in smartctl database [for details use: -P showall]ATA Version is:   ATA8-ACS (minor revision not indicated)SATA Version is:  SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)Local Time is:    Tue Nov 13 11:31:29 2018 HKTSMART support is: Available - device has SMART capability.SMART support is: Enabled=== START OF READ SMART DATA SECTION ===SMART Status not supported: Incomplete response, ATA output registers missingSMART overall-health self-assessment test result: PASSEDWarning: This result is based on an Attribute check.General SMART Values:Offline data collection status:  (0x00)	Offline data collection activity					was never started.					Auto Offline Data Collection: Disabled.Self-test execution status:      (   0)	The previous self-test routine completed					without error or no self-test has ever 					been run.Total time to complete Offline data collection: 		(  120) seconds.Offline data collectioncapabilities: 			 (0x5b) SMART execute Offline immediate.					Auto Offline data collection on/off support.					Suspend Offline collection upon new					command.					Offline surface scan supported.					Self-test supported.					No Conveyance Self-test supported.					Selective Self-test supported.SMART capabilities:            (0x0003)	Saves SMART data before entering					power-saving mode.					Supports SMART auto save timer.Error logging capability:        (0x01)	Error logging supported.					General Purpose Logging supported.Short self-test routine recommended polling time: 	 (   2) minutes.Extended self-test routinerecommended polling time: 	 ( 255) minutes.SCT capabilities: 	       (0x003d)	SCT Status supported.					SCT Error Recovery Control supported.					SCT Feature Control supported.					SCT Data Table supported.SMART Attributes Data Structure revision number: 16Vendor Specific SMART Attributes with Thresholds:ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       2355  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       706  5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always       -       0  7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always       -       0  8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline      -       0  9 Power_On_Hours          0x0032   094   094   000    Old_age   Always       -       2648 10 Spin_Retry_Count        0x0033   114   100   030    Pre-fail  Always       -       0 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       498191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       878192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       27193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       17413194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       38 (Min/Max 7/49)196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       0198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0220 Disk_Shift              0x0002   100   100   000    Old_age   Always       -       0222 Loaded_Hours            0x0032   096   096   000    Old_age   Always       -       1819223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0224 Load_Friction           0x0022   100   100   000    Old_age   Always       -       0226 Load-in_Time            0x0026   100   100   000    Old_age   Always       -       264240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline      -       0SMART Error Log Version: 1ATA Error Count: 1	CR = Command Register [HEX]	FR = Features Register [HEX]	SC = Sector Count Register [HEX]	SN = Sector Number Register [HEX]	CL = Cylinder Low Register [HEX]	CH = Cylinder High Register [HEX]	DH = Device/Head Register [HEX]	DC = Device Command Register [HEX]	ER = Error register [HEX]	ST = Status register [HEX]Powered_Up_Time is measured from power on, and printed asDDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,SS=sec, and sss=millisec. It "wraps" after 49.710 days.Error 1 occurred at disk power-on lifetime: 1657 hours (69 days + 1 hours)  When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were:  ER ST SC SN CL CH DH  -- -- -- -- -- -- --  40 51 58 40 f9 a7 46  Error: UNC 88 sectors at LBA = 0x06a7f940 = 111671616  Commands leading to the command that caused the error were:  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name  -- -- -- -- -- -- -- --  ----------------  --------------------  25 ff 00 98 f6 a7 40 00      01:34:49.548  READ DMA EXT  25 ff 00 98 f2 a7 40 00      01:34:49.534  READ DMA EXT  25 ff a8 f0 f1 a7 40 00      01:34:49.493  READ DMA EXT  25 ff 00 f0 ed a7 40 00      01:34:49.488  READ DMA EXT  25 ff 00 f0 e9 a7 40 00      01:34:49.481  READ DMA EXTSMART Self-test log structure revision number 1No self-tests have been logged.  [To run self-tests, use: smartctl -t]SMART Selective self-test log data structure revision number 1 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS    1        0        0  Not_testing    2        0        0  Not_testing    3        0        0  Not_testing    4        0        0  Not_testing    5        0        0  Not_testingSelective self-test flags (0x0):  After scanning selected spans, do NOT read-scan remainder of disk.If Selective self-test is pending on power-up, resume after 0 minute delay.

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